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International Journal of Applied Electromagnetics and Mechanics

International Journal of Applied Electromagnetics and Mechanics

Published in Association with IOS Press

eISSN: 18758800 | ISSN: 13835416

The aim of the International Journal of Applied Electromagnetics and Mechanics is to contribute to intersciences coupling applied electromagnetics, mechanics and materials. The journal also intends to stimulate the further development of current technology in industry. The main subjects covered by the journal are:

- Physics and mechanics of electromagnetic materials and devices
- Computational electromagnetic in materials and devices
- Applications of electromagnetic fields and forces

The aim of the International Journal of Applied Electromagnetics and Mechanics is to contribute to intersciences coupling applied electromagnetics, mechanics and materials. The journal also intends to stimulate the further development of current technology in industry. The main subjects covered by the journal are:

  • Physics and mechanics of electromagnetic materials and devices
  • Computational electromagnetics in materials and devices
  • Applications of electromagnetic fields and materials

The three interrelated key subjects – electromagnetics, mechanics and materials - include the following aspects: electromagnetic NDE, electromagnetic machines and devices, electromagnetic materials and structures, electromagnetic fluids, magnetoelastic effects and magnetosolid mechanics, magnetic levitations, electromagnetic propulsion, bioelectromagnetics, and inverse problems in electromagnetics.

The editorial policy is to combine information and experience from both the latest high technology fields and as well as the well-established technologies within applied electromagnetics.

The editors hope to build on existing theoretical framework through the interplay of old and new concepts. In order to assist readers to quickly grasping the current status of research in a specific area of applied electromagnetics, both contributed and invited submissions are welcome for publication in special issues, supplemental issues and regular issues.

Editor in Chief
Antonello Tamburrino University of Cassino and Southern Latium, Italy
Founding Editor
Kenzo Miya Japan Society of Maintenology, Japan
Associate Editor
Zhenmao Chen Xi’an Jiaotong University, China
Paolo Di Barba University of Pavia, Italy
Hiaoyan Huang Zhejiang University, China
Mario Lucido University of Cassino and Southern Lazio, Italy
Maria Evelina Mognaschi University of Pavia, Italy
Yasemin Öner Yildiz Technical University, Turkey
Yoshifuru Saito Hosei University, Japan
Ruben Specogna University of Udine, Italy
Shejuan Xie Xi'an Jiaotong University, China
Noritaka Yusa Tohoku University, Japan
Marcin Ziolkowski West Pomeranian University of Technology, Poland
Associate Editor & Social Media Editor
Stefano Laureti University of Calabria, Italy
Senior Editor
Alain Bossavit Génie Électrique et Électronique de Paris, France
Editorial Board Member
Sándor Bilicz Budapest University of Technology and Economics, Hungary
Ilhem Bouchareb National Polytechnical University of Constantine, Algeria
Tomasz Chady West Pomeranian University of Technology, Poland
Bogdan Cranganu-Cretu ABB Corporate Research Center, Switzerland
Francesco dell'Isola Università degli Studi dell'Aquila, Italy
Yasushi Ido Nagoya Institute of Technology, Japan
Hideki Kawaguchi Muroran Institute of Technology, Japan
Vincenzo Paolo Loschiavo University of Sannio, Italy
Biswajeet Mukherjee University of Delhi, India
Iosif Nemoianu National University of Science and Technology Politehnica Bucharest, Romania
Jószef Pávó Budapest University of Technology and Economics, Hungary
Jinhao Qiu Nanjing University of Aeronautics and Astronautics, China
Antonio Quercia University of Naples Federico II, Italy
Gael Sebald Université de Lyon, France
Salvatore Ventre University of Cassino and Lazio Medirionale, Italy
Yanliang Xu Shandong University, China
  • Clarivate Analytics: Science Citation Index Expanded (SCIE)
  • EBSCO
  • Ei Compendex
  • ProQuest
  • Scopus
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